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For citations:

Kaziuchyts V.O., Borovikov S.M., Shneiderov E.N. Model for Prediction of Testing Time of a Computer Program for Automated Reliability Evaluation of Semiconductor Devices. Doklady BGUIR. 2022;20(7):72-80. (In Russ.) https://doi.org/10.35596/1729-7648-2022-20-7-72-80

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ISSN 1729-7648 (Print)
ISSN 2708-0382 (Online)

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