Distance Measure for Controlled Random Tests
https://doi.org/10.35596/1729-7648-2022-20-6-52-60
Abstract
The problem of constructing characteristics of the difference between test sequences is investigated. Its relevance for generating controlled random tests and the complexity of finding difference measures for symbolic tests are substantiated. The limitations of using the Hamming and Damerau–Levenshtein distances to obtain a measure of the difference between test patterns are shown. For an arbitrary case, a new measure of the difference between two symbolic test sets is determined based on the interval used in the theory of the chain of successive events. The distance D(Ti, Tk) between test patterns Ti and Tk, using the interval characteristic, is based on determining independent pairs of identical (equal) symbols belonging to two patterns and calculating the intervals between them. The combinatorial nature of the calculation, the proposed difference measure for symbolic test patterns of an arbitrary alphabet and dimension, is shown. An example of calculating this measure is given and its possible modifications and limitations are shown. The application of the measure of difference is considered for the case of multi-run testing of memory devices based on address sequences pA with even p repetition of addresses. For the case p = 2, mathematical relations are given for calculating intervals and distances D(Ti, Tk) for address sequences 2A used for controlled random testing of memory devices. Experimental results are presented confirming the effectiveness of the proposed difference measure.
About the Authors
V. N. Yarmolik
Belarusian State University of Informatics and Radioelectronics
Belarus
Belarus
Dr. of Sci. (Eng.), Professor
220013, Minsk, P. Brovka St., 6, tel. +375 29 769-96-77
M. A. Shauchenka
Darmstadt Technical University
Germany
Germany
Shauchenka M.A., Student
V. V. Petrovskaya
Belarusian State University of Informatics and Radioelectronics
Belarus
Belarus
Petrovskaya V.V., M. Sci.
References
1. Huang R., Sun W., Xu Y., Chen H., Towey D., Xia X. A Survey on Adaptive Random Testing. IEEE Transactions on Software Engineering. 2021;47(10):2052-2083. DOI: 10.1109/tse.2019.2942921.
2. Yarmolik V.N, Mrozek I., Yarmolik S.V. Controlled Method of Random Test Synthesis. Automatic Control and Computer Sciences. 2015;49(6):395-403.
3. Levantsevich V.A., Yarmolik V.N. [Multiple controlled random testing]. Doklady BGUIR = Doklady BGUIR. 2019;121(3):65-69. (in Russ.)
4. Sadovsky M.G. Comparison of symbol sequences: no editing, no alignment. Open Systems & Information Dynamics. 2002;09(01):19-36. DOI: 10.1023/A:1014278811727.
5. Bard G.V. Spelling-error tolerant, order-independent pass-phrases via the Damerau – Levenshtein string-edit distance metric. Proc. of the Fifth Australasian Symposium on ACSW Frontiers. 2007:117-124.
6. Gumenyuk A.S., Skiba A.A., Pozdnichenko N.N., Shpynov S.N. About Similarity Measures of Components Arrangement of Naturally Ordered Data Arrays. SPIIRAS Proceedings. 2019;18(2):471-503. DOI: 10.15622/sp.18.2.471-503. / Gumenjuk A.S, Skiba A.A., Pozdnichenko N.N., Shpunov S.N. [On the measures of similarity of the arrangement of components in arrays of naturally ordered data]. Proc. SPIIRAS. 2019;18(2):471-503. DOI: 10.15622/sp.18.2.471-503. (In Russ.)
7. Mrozek I., Yarmolik V.N. Transparent Memory Tests Based on the Double Address Sequences. Entropy. 2021;23:894. DOI: 10.3390/e23070894.
Review
For citations:
Yarmolik V.N., Shauchenka M.A., Petrovskaya V.V. Distance Measure for Controlled Random Tests. Doklady BGUIR. 2022;20(6):52-60. (In Russ.) https://doi.org/10.35596/1729-7648-2022-20-6-52-60
Views: 328
Email this article 