Experimental studies and a double gate JFET model for analog integrated circuits | Galkin | Doklady BGUIR

Doklady BGUIR
Doklady BGUIR

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ISSN 1729-7648 (Print)
ISSN 2708-0382 (Online)

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Galkin Y.D., Dvornikov O.V., Tchekhovski V.A., Prokopenko N.N. Experimental studies and a double gate JFET model for analog integrated circuits. Doklady BGUIR. 2021;19(7):5-12. (In Russ.) https://doi.org/10.35596/1729-7648-2021-19-7-5-12

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ISSN 1729-7648 (Print)
ISSN 2708-0382 (Online)

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About the Authors

Y. D. Galkin
Belarusian State University of Informatics and Radioelectronics; Institute for Nuclear Problems of Belarusian State University
Belarus

Galkin Y.D., Postgraduate student, Junior Researcher at the Electronic Methods and Experiment Means Laboratory

Minsk

O. V. Dvornikov
Minsk Research Instrument-Making Institute JSC
Belarus

Dvornikov O.V., D.Sc., Associate Professor, Main Researcher

Minsk

V. A. Tchekhovski
Institute for Nuclear Problems of Belarusian State University
Belarus

Tchekhovski V.A., Laboratory Manager of the Electronic Methods and Experiment Means Laboratory

Minsk

N. N. Prokopenko
Don State Technical University
Russian Federation

Prokopenko N.N., D.Sc., Professor, Head of the Information Systems and Radioelectronics Department

Rostov-on-Don

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