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Experimental studies and a double gate JFET model for analog integrated circuits

https://doi.org/10.35596/1729-7648-2021-19-7-5-12

Abstract

One of directions of improving parameters of analog integrated circuits is a development of new and modernization of existing designs of integrated elements without significantly changing of a technological route of integrated circuit manufacturing with a simultaneous creation of new integrated elements models. The article considers the results of experimental studies of the double gate junction field-effect transistor manufactured according to the 3CBiT technological route of JSC Integral. Based on the obtained results, the electrical model of double gate junction field-effect transistor is proposed, which describes the features of its application in analog integrated circuits. Comparison of I-V characteristics of measurements results and created model simulation are presented. A small capacity and a reverse current of a double gate junction field-effect transistor top gate, an ability to compensate for the DC (direct current) component of an input current provide a significant improvement in the characteristics of analog integrated circuits such as electrometric operational amplifiers and charge-sensitive amplifiers. The developed double gate junction field-effect transistor can be used in signal readout devices required in the analog interfaces of space instrument sensors and nuclear electronics.

About the Authors

Y. D. Galkin
Belarusian State University of Informatics and Radioelectronics; Institute for Nuclear Problems of Belarusian State University
Belarus

Galkin Y.D., Postgraduate student, Junior Researcher at the Electronic Methods and Experiment Means Laboratory

Minsk



O. V. Dvornikov
Minsk Research Instrument-Making Institute JSC
Belarus

Dvornikov O.V., D.Sc., Associate Professor, Main Researcher

Minsk



V. A. Tchekhovski
Institute for Nuclear Problems of Belarusian State University
Belarus

Tchekhovski V.A., Laboratory Manager of the Electronic Methods and Experiment Means Laboratory

Minsk



N. N. Prokopenko
Don State Technical University
Russian Federation

Prokopenko N.N., D.Sc., Professor, Head of the Information Systems and Radioelectronics Department

Rostov-on-Don



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For citations:


Galkin Y.D., Dvornikov O.V., Tchekhovski V.A., Prokopenko N.N. Experimental studies and a double gate JFET model for analog integrated circuits. Doklady BGUIR. 2021;19(7):5-12. (In Russ.) https://doi.org/10.35596/1729-7648-2021-19-7-5-12

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ISSN 1729-7648 (Print)
ISSN 2708-0382 (Online)