Experimental studies and a double gate JFET model for analog integrated circuits
https://doi.org/10.35596/1729-7648-2021-19-7-5-12
Abstract
One of directions of improving parameters of analog integrated circuits is a development of new and modernization of existing designs of integrated elements without significantly changing of a technological route of integrated circuit manufacturing with a simultaneous creation of new integrated elements models. The article considers the results of experimental studies of the double gate junction field-effect transistor manufactured according to the 3CBiT technological route of JSC Integral. Based on the obtained results, the electrical model of double gate junction field-effect transistor is proposed, which describes the features of its application in analog integrated circuits. Comparison of I-V characteristics of measurements results and created model simulation are presented. A small capacity and a reverse current of a double gate junction field-effect transistor top gate, an ability to compensate for the DC (direct current) component of an input current provide a significant improvement in the characteristics of analog integrated circuits such as electrometric operational amplifiers and charge-sensitive amplifiers. The developed double gate junction field-effect transistor can be used in signal readout devices required in the analog interfaces of space instrument sensors and nuclear electronics.
About the Authors
Y. D. GalkinBelarus
Galkin Y.D., Postgraduate student, Junior Researcher at the Electronic Methods and Experiment Means Laboratory
Minsk
O. V. Dvornikov
Belarus
Dvornikov O.V., D.Sc., Associate Professor, Main Researcher
Minsk
V. A. Tchekhovski
Belarus
Tchekhovski V.A., Laboratory Manager of the Electronic Methods and Experiment Means Laboratory
Minsk
N. N. Prokopenko
Russian Federation
Prokopenko N.N., D.Sc., Professor, Head of the Information Systems and Radioelectronics Department
Rostov-on-Don
References
1. Close J.P., Counts L.W. A 50-fA junction-isolated operational amplifier. IEEE Journal of Solid – State Circuits. 1988; 23(3):843-851. DOI: 10.1109/4.328.
2. Nanver L.K. and Goudena E.J.G. Design considerations for integrated high-frequency p-channel JFETs. IEEE Transactions on Electron Devices. 1988;35(11):1924-1934. DOI: 10.1109/16.7406.
3. Fazzi A., Rehak P. «Gate-to-gate» BJT obtained from the double-gate input JFET to reset charge preamplifiers. Nuclear Instruments and Methods in Physics Research. 1996; A377:453-458. DOI: https://doi.org/10.1016/0168-9002(96)00238-0.
4. Fazzi A., Rehak P. A double-gate double-feedback JFET charge-sensitive preamplifier. Nuclear Instruments and Methods in Physics Research. 1996;A380(1-2):346-349. DOI: https://doi.org/10.1016/S0168-9002(96)00355-5.
5. Baturitsky M.A., Dvornikov O.V. The double-gate p-JFET-inputted amplifier for low-capacitance detectors. Nuclear Instruments and Methods in Physics Research. 1998;419(1):99-104. DOI: https://doi.org/10.1016/S0168-9002(98)00900-0.
6. Makris N., Bucher M., Jazaeri F., Sallese J. A Compact Model for Static and Dynamic Operation of Symmetric Double-Gate Junction FETs. 2018 48th European Solid-State Device Research Conference (ESSDERC). 2018;238-241. DOI: 10.1109/essderc.2018.8486848.
7. Petrosyants K.O., Ismail-Zade M.R., Sambursky L. Compact Si JFET model for cryogenic temperature. Cryogenics. 2020; 108:1-6. DOI: https://doi.org/10.1016/j.cryogenics.2020.103069.
8. Prokopenko N.N., Dvornikov O.V., Bugakova A.V. [Low temperature and radiation hardned analog integrated circuit design for sensors signal processing]. Moskow: SOLON-PRESS; 2021.
9. Abramov I.I. Dvornikov O.V. [Analog integrated circuit design for precision measurement systems]. Minsk: Akademiya upravleniya pri Prezidente Respubliki Belarus'; 2006. (In Russ.).
10. Dostal I. [Operational amplifiers]. Moskow: Mir; 1982. (In Russ.).
Review
For citations:
Galkin Y.D., Dvornikov O.V., Tchekhovski V.A., Prokopenko N.N. Experimental studies and a double gate JFET model for analog integrated circuits. Doklady BGUIR. 2021;19(7):5-12. (In Russ.) https://doi.org/10.35596/1729-7648-2021-19-7-5-12