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Nguen T.D., Zanko A.I., Golosov D.A., Zavadski S.M., Melnikov S.N., Kolos V.V., To T.Q. Influence of annealing on structure, phase and electrophysical properties of vanadium oxide films. Doklady BGUIR. 2021;19(3):22-30. (In Russ.) https://doi.org/10.35596/1729-7648-2021-19-3-22-30

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ISSN 1729-7648 (Print)
ISSN 2708-0382 (Online)