Individual prediction of the reliability of high power transistors for electronic devices of medical purposes

When assembling electronic complexes for medical purposes, it is important to install highly reliable semiconductor devices in electronic equipment. Experimental studies and the example of high-power bipolar transistors in this work show how you can select copies of an increased level of reliability for their subsequent installation in critical electronic devices. To select highly reliable samples, individual forecasting was used according to informative parameters measured for a particular sample at the initial moment in time. Experimental studies (training experiment) included measuring at the initial moment of time for each sample of transistors of electrical parameters, which may contain information on reliability, and then conducting accelerated tests of transistors for reliability for a time corresponding to normal operating conditions specified in the technical documentation. The training experiment is performed once and used to obtain a predictive rule, which is applied to other similar samples that did not participate in the training experiment. To obtain a predictive rule, the method of majority logic was used. Prediction is performed in the form of assigning a specific sample to the class of highly reliable samples for a given future operating time. To perform prediction, the values of the informative parameters are measured at the initial moment of time for a particular sample of interest, they are converted into binary numbers (zero or one) using the threshold values found from the results of the training experiment, and the decision on the correspondence of the sample to the class of highly reliable transistors is made by a set of binary numbers. To classify a sample as a highly reliable one, it is sufficient that the number of ones exceeds the number of zeros in the resulting set of binary numbers.

1. Kharchenko V.A.[ Problems of Reliability of Electronic Components]. Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Proceedings of higher educational institutions. Materials of Electronics Engineering. 2015;18(1):52-57. (In Russ.)

2. Borovikov S.M. [Statistical forecasting for the rejection of potentially unreliable electronic products]. Moscow: New Knowledge; 2013. (In Russ.)

3. Piganov M.N. [Individual prediction of the quality of elements and components of micro-assemblies]. Moscow: New technologies; 2002. (In Russ.)

4. Gorlov M.I., Sergeev V.A. [Modern diagnostic methods of quality control and reliability of semiconductor products]. Ulyanovsk: UlSTU; 2015. (In Russ.)

5. Robinson L. E. Life expectancy in electronic components and 10th rule. Testing. 1998;1:16.

6. Bipolar Power Transistor. Data Book 1998. TEMIC Semiconductors. 1997;12:35-42.

7. Borovikov S.M., Shneiderov E.N., Plebanovich V.I., Beresnevich A.I., Burak I.A. [An experimental study of the degradation of electronic products]. Doklady BGUIR = Doklady BGUIR. 2017;2 (104):45-52. (In Russ.)

8. Borovikov S.M., Tsyrelchuk I.N., Shneiderov E.N., Beresnevich A.I. [Predicting the reliability of electronic products]. Minsk: MGVRK; 2010. (In Russ.)

9. Mishanov R.O., Piganov M.N. [Methodology for determining a set of informative parameters for individual prediction of the quality and reliability of radio electronic equipment]. Nadejnost i kachestvo slojnih sistem = Reliability and quality of complex systems. 2017;17(1):93-103. (In Russ.)

10. Borovikov S.M., Beresnevich A.I., Khmyl A.A., Emelyanov A.V., Tsyrelchuk I.N. [Method for predicting the reliability of electronic products]. Doklady Natsional’noi akademii nauk Belarusi = Doklady of the National Academy of Sciences of Belarus. 2006;50(4):105-109. (In Russ.)