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For citations:

Borovikov S.M., Shneiderov E.N., Berasnevich A.I., Kaziuchyts V.O. Individual forecasting of reliability of bipolar transistors by using electrical voltage as a simulation factor. Doklady BGUIR. 2020;18(5):80-88. (In Russ.) https://doi.org/10.35596/1729-7648-2020-18-5-80-88

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ISSN 1729-7648 (Print)
ISSN 2708-0382 (Online)

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