THIN FILM TRANSISTORS WITH InGaZnO-SEMICONDUCTOR LAYER FOR ACTIVE MATRIX ADDRESSING
https://doi.org/10.35596/1729-7648-2019-125-7-101-106
Abstract
The paper presents the results of a study of thin-film transistors based on the InGaZnO semiconductor compound (IGZO) for active-matrix displays addressing formed by magnetron plasma-chemical deposition. Their structural-morphological and electrophysical properties are investigated. Carrier mobility is analyzed using the Hall method. The effect of annealing in vacuum, an oxygen atmosphere, and a nitrogen atmosphere on the grain size of an IGZO film was investigated. The resulting layers are characterized by high mobility of charge carriers, which allows their use in the manufacture of new-generation LCD and OLED displays.
About the Authors
B. A. KazarkinBelarus
PG student
220013, Republic of Belarus, Minsk, P. Brovki st., 6
tel. +375-17-293-88-75
A. A. Stepanov
Belarus
Senior researcher of SRL 4.7 of R&D Department
220013, Republic of Belarus, Minsk, P. Brovki st., 6
tel. +375-17-293-88-75
Y. U. Mukha
Belarus
Researcher of SRL 4.7 of R&D Department
220013, Republic of Belarus, Minsk, P. Brovki st., 6
tel. +375-17-293-88-75
I. I. Zakharchenia
Belarus
Engineer of SRL 4.7 of R&D Department
220013, Republic of Belarus, Minsk, P. Brovki st., 6
tel. +375-17-293-88-75
Y. A. Khakhlou
Russian Federation
Head of Technological Development Department
A. G. Smirnov
Russian Federation
Smirnov Aliaksandr Georgievich,Doctor of Technical Sciences, professor, head of SRL 4.7 of R&D Department
220013, Republic of Belarus, Minsk, P. Brovki st., 6
tel. +375-17-293-88-75
References
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Review
For citations:
Kazarkin B.A., Stepanov A.A., Mukha Y.U., Zakharchenia I.I., Khakhlou Y.A., Smirnov A.G. THIN FILM TRANSISTORS WITH InGaZnO-SEMICONDUCTOR LAYER FOR ACTIVE MATRIX ADDRESSING. Doklady BGUIR. 2019;(7 (125)):101-106. (In Russ.) https://doi.org/10.35596/1729-7648-2019-125-7-101-106