Various anti-fuse structures for field programmable gate arrays and programmable read-only memories
Abstract
The use of anti-fuses as programmable elements is becoming popular in field programmable gate arrays and programmable read-only memories. The characteristics of various structures of anti-fuses and compromise between performance and reliability will be discussed in this paper.
About the Authors
V. A. Petrovich
Белорусский государственный университет информатики и радиоэлектроники, Республика Беларусь
Belarus
Belarus
V. P. Bondarenko
Белорусский государственный университет информатики и радиоэлектроники, Республика Беларусь
Belarus
Belarus
A. L. Dolgiy
Белорусский государственный университет информатики и радиоэлектроники, Республика Беларусь
Belarus
Belarus
S. V. Redko
Белорусский государственный университет информатики и радиоэлектроники, Республика Беларусь
Belarus
Belarus
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Review
For citations:
Petrovich V.A., Bondarenko V.P., Dolgiy A.L., Redko S.V. Various anti-fuse structures for field programmable gate arrays and programmable read-only memories. Doklady BGUIR. 2018;(5):38-43. (In Russ.)
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