SECTOR LOCALIZATION, PARAMETERIZATION AND IDENTIFICATION OF REFERENCE POINTS BASED ON CORNER COEFFICIENTS FOR ALIGNING THE OVERLAPPING IMAGES
Abstract
Algorithms of sector localization and parameterization of reference points in the wavelet domain for aligning the overlapping images based on the utility of corner coefficients to describe the contour structure in the vicinity of the reference point are proposed. It is shown that these algorithms compared to the methods of SIFT and SURF provide a reduction in the computational complexity of localization and parameterization of reference points and increase the stability of their descriptors at parallax.
About the Authors
O. J. Al-Furaiji
Белорусский государственный университет информатики и радиоэлектроники
Belarus
Belarus
V. K. Kanapelka
Белорусский государственный университет информатики и радиоэлектроники
Belarus
Belarus
V. YU. Tsviatkou
Белорусский государственный университет информатики и радиоэлектроники
Belarus
Belarus
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Review
For citations:
Al-Furaiji O.J., Kanapelka V.K., Tsviatkou V.Yu. SECTOR LOCALIZATION, PARAMETERIZATION AND IDENTIFICATION OF REFERENCE POINTS BASED ON CORNER COEFFICIENTS FOR ALIGNING THE OVERLAPPING IMAGES. Doklady BGUIR. 2012;(6):122-128. (In Russ.)
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