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Dissimilarity Measure Properties of Binary Test Patterns of Controlled Random Tests

https://doi.org/10.35596/1729-7648-2023-21-2-86-94

Abstract

The problem of application of the dissimilarity measures for binary test sequences is investigated. Their relevance in generating controlled random tests is substantiated. Dissimilarity measure AD(Ti, Tk) between test sets Ti and Tk is considered, using the characteristic of the distance D(ti,j, tk,r) between ti,j and tk,r, which is based on the determination of independent pairs of identical data ti,j = tk,r belonging to two patterns Ti and Tk. This measure AD(Ti, Tk) allows us to estimate the degree of difference between two test sets Ti and Tk, which may be indistinguishable when using other difference measures, including the Hamming distance. Upper and lower estimates for the measurement of dissimilarity are obtained for the case of inverse test patterns and arbitrary test patterns Ti and Tk with different combinations of their weights wi and wk. Examples of calculating the boundary values of the specified dissimilarity measure and the ratio of their values are given. Experimental results confirm the correctness of the obtained boundary values of the indicated dissimilarity measure AD(Ti, Tk) and show the possibility of their application for its evaluation.

About the Authors

V. N. Yarmolik
Belarusian State University of Informatics and Radioelectronics
Belarus

Yarmolik Vyacheslav Nikolaevich, Dr. of Sci. (Eng.), Professor

220013, Minsk, P. Brovki St., 6

Tel.: +375 29 769-96-77 



V. V. Petrovskaya
Belarusian State University of Informatics and Radioelectronics
Belarus

M. of Sci.

Minsk



A. A. Ivaniuk
Belarusian State University of Informatics and Radioelectronics
Belarus

Dr. of Sci. (Eng.), Associate Professor, Professor at the Computer Science Department, Head of the Joint Educational Laboratory “SK Hynix Memory Solutions Eastern Europe”

Minsk



References

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Review

For citations:


Yarmolik V.N., Petrovskaya V.V., Ivaniuk A.A. Dissimilarity Measure Properties of Binary Test Patterns of Controlled Random Tests. Doklady BGUIR. 2023;21(2):86-94. (In Russ.) https://doi.org/10.35596/1729-7648-2023-21-2-86-94

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ISSN 1729-7648 (Print)
ISSN 2708-0382 (Online)