For citations:
Kaziuchyts V.O., Kalita E.V., Borovikov S.M., Berasnevich A.I. Accelerated Testing of High Power Transistors for Long Operation when Solving Problems of Prediction of their Reliability by the Method of Imitation Simulation. Doklady BGUIR. 2022;20(4):36-43. (In Russ.) https://doi.org/10.35596/1729-7648-2022-20-4-36-43
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