FORECASTING METHOD OF INDIVIDUAL Phasing of electronic products by simulation IMPACTS
Abstract
The systematization of the method of simulation effects applied to individual forecasting gradual failures of electronic equipment is carried out. The method used to develop a method for predicting gradual failures of bipolar transistors. It allows the reaction of the functional parameter specific instance (transistor) on the impact of simulation at the initial time to predict the value for a given future developments and decide on the reliability of this instance of the phase-out of use for this.
About the Author
S. M. Baravikou
Белорусский государственный университет информатики и радиоэлектроники
Belarus
Belarus
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Review
For citations:
Baravikou S.M. FORECASTING METHOD OF INDIVIDUAL Phasing of electronic products by simulation IMPACTS. Doklady BGUIR. 2013;(6):12-18. (In Russ.)
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