EFFECTIVE METHOD OF UNRELIABLE CMOS CIRCUTS IDENTIFICATION
Abstract
With increase of complexity factor of integrated circuits and reduction of the geometrical dimensions of integrated structures and detection of unreliable circuits still remains an actual problem. A method of rejection of potentially unreliable circuits most often used in production is imitation of operational modes at a stage of tests. However complexity and duration of realization of the specified method does it practically not suitable in the conditions of mass production of integrated circuits.
About the Authors
A. I. Belous
ОАО «ИНТЕГРАЛ»
Belarus
Belarus
A. V. Prybylski
Белорусский государственный университет информатики и радиоэлектроники
Belarus
Belarus
References
1. Красников Г.Я., Зайцев Н.А. Физико-технологические основы обеспечения качества СБИС. М., 1998.
2. Козырь И.Я. Качество и надежность интегральных микросхем. М., 1997.
3. Красников Г.Я. Конструктивные особенности субмикронных МОП-транзисторов. М., 2004.
4. Денисенко В.В. Компактные модели МОП-транзисторов для SPICE в микро- и наноэлектронике. М., 2010.
Review
For citations:
Belous A.I., Prybylski A.V. EFFECTIVE METHOD OF UNRELIABLE CMOS CIRCUTS IDENTIFICATION. Doklady BGUIR. 2013;(1):94-96. (In Russ.)
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