<?xml version="1.0" encoding="UTF-8"?>
<!DOCTYPE article PUBLIC "-//NLM//DTD JATS (Z39.96) Journal Publishing DTD v1.3 20210610//EN" "JATS-journalpublishing1-3.dtd">
<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">bsuir</journal-id><journal-title-group><journal-title xml:lang="ru">Доклады БГУИР</journal-title><trans-title-group xml:lang="en"><trans-title>Doklady BGUIR</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">1729-7648</issn><issn pub-type="epub">2708-0382</issn><publisher><publisher-name>БГУИР</publisher-name></publisher></journal-meta><article-meta><article-id custom-type="elpub" pub-id-type="custom">bsuir-903</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>Статьи</subject></subj-group></article-categories><title-group><article-title>ОПРЕДЕЛЕНИЕ ИНТЕНСИВНОСТЕЙ РАССЕИВАНИЯ ЭЛЕКТРОНОВ В ОДИНОЧНОМ СЛОЕ ГРАФЕНА</article-title><trans-title-group xml:lang="en"><trans-title>Intensity determination of the scattering rates in the monolayer graphene</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Муравьев</surname><given-names>В. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Murav'ev</surname><given-names>V. V.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Мищенко</surname><given-names>В. Н.</given-names></name><name name-style="western" xml:lang="en"><surname>Mishchenka</surname><given-names>V. N.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Белорусский государственный университет информатики и радиоэлектроники</institution></aff><aff xml:lang="en"><institution>Belarusian state university of informatics and radioelectronics</institution></aff></aff-alternatives><pub-date pub-type="collection"><year>2017</year></pub-date><pub-date pub-type="epub"><day>03</day><month>06</month><year>2019</year></pub-date><volume>0</volume><issue>6</issue><fpage>42</fpage><lpage>47</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Муравьев В.В., Мищенко В.Н., 2019</copyright-statement><copyright-year>2019</copyright-year><copyright-holder xml:lang="ru">Муравьев В.В., Мищенко В.Н.</copyright-holder><copyright-holder xml:lang="en">Murav'ev V.V., Mishchenka V.N.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://doklady.bsuir.by/jour/article/view/903">https://doklady.bsuir.by/jour/article/view/903</self-uri><abstract><p>Приведены результаты моделирования интенсивностей рассеивания электронов в одиночном слое графена без подложки. Высокая подвижность носителей заряда, максимально полученная среди всех известных материалов, делает графен перспективным материалом для создания новых полупроводниковых приборов с хорошими выходными характеристиками. Установлено преобладание электрон-электронного рассеивания над другими видами рассеивания в области умеренных величин энергии поля в одиночном слое графена. Исследованные зависимости интенсивностей рассеивания носителей заряда позволят путем моделирования с использованием метода Монте Карло получить основные характеристики переноса носителей заряда в полупроводниковых структурах, содержащих слои графена.</p></abstract><trans-abstract xml:lang="en"><p>The results of simulation of the electron scattering rates in a single graphene layer without substrate are presented. High mobility of charge carriers, maximally obtained among all known materials, makes graphene a promising material for the creation of new semiconductor devices with good output characteristics. The prevalence of electron-electron scattering over other types of scattering in the region of moderate field energy in a single graphene layer is established. The investigated dependences of the rates of carrier scattering will enable to obtain the main characteristics of charge carrier transfer in semiconductor structures containing graphene layers by modeling using the Monte Carlo method.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>графен</kwd><kwd>полупроводниковая структура</kwd><kwd>интенсивность рассеивания</kwd><kwd>процессы переноса электронов</kwd><kwd>метод Монте Карло</kwd></kwd-group><kwd-group xml:lang="en"><kwd>graphene</kwd><kwd>semiconductor structure</kwd><kwd>scattering rates</kwd><kwd>electron transport processes</kwd><kwd>Monte Carlo method</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">A graphene field-effect device / M.С. Lemme [et al.] // IEEE Electron Dev. Lett. 2007. Vol. 28. P. 282-284.</mixed-citation><mixed-citation xml:lang="en">A graphene field-effect device / M.С. Lemme [et al.] // IEEE Electron Dev. Lett. 2007. Vol. 28. P. 282-284.</mixed-citation></citation-alternatives></ref><ref id="cit2"><label>2</label><citation-alternatives><mixed-citation xml:lang="ru">-GHz transistors from wafer-scale epitaxial graphene / Y.-M. Lin [et al.] // Science. 2010. Vol. 327. P. 662.</mixed-citation><mixed-citation xml:lang="en">-GHz transistors from wafer-scale epitaxial graphene / Y.-M. Lin [et al.] // Science. 2010. Vol. 327. P. 662.</mixed-citation></citation-alternatives></ref><ref id="cit3"><label>3</label><citation-alternatives><mixed-citation xml:lang="ru">Туннельные полевые транзисторы на основе графена / Д.А. Свинцов [и др.] // Физика и техника полупроводников. 2013. Том 47, вып. 2. С. 244-250.</mixed-citation><mixed-citation xml:lang="en">Туннельные полевые транзисторы на основе графена / Д.А. Свинцов [и др.] // Физика и техника полупроводников. 2013. Том 47, вып. 2. С. 244-250.</mixed-citation></citation-alternatives></ref><ref id="cit4"><label>4</label><citation-alternatives><mixed-citation xml:lang="ru">Influence of electron-electron scattering on transport characteristics in monolayer grapheme / X. Li [et al.] // Appl. Phys. Letters. 2010. Vol. 97. P. 082101.</mixed-citation><mixed-citation xml:lang="en">Influence of electron-electron scattering on transport characteristics in monolayer grapheme / X. Li [et al.] // Appl. Phys. Letters. 2010. Vol. 97. P. 082101.</mixed-citation></citation-alternatives></ref><ref id="cit5"><label>5</label><citation-alternatives><mixed-citation xml:lang="ru">Chauhan Jyotsna, Guo Jing. High-field transport and velocity saturation in grapheme // Appl. Phys. Letters. 2009. Vol. 95. P. 023120.</mixed-citation><mixed-citation xml:lang="en">Chauhan Jyotsna, Guo Jing. High-field transport and velocity saturation in grapheme // Appl. Phys. Letters. 2009. Vol. 95. P. 023120.</mixed-citation></citation-alternatives></ref><ref id="cit6"><label>6</label><citation-alternatives><mixed-citation xml:lang="ru">High-field transport in two-dimensional graphene / Fang Tian [et al.] // Physical Review. 2011. Vol. B 84. P. 125450.</mixed-citation><mixed-citation xml:lang="en">High-field transport in two-dimensional graphene / Fang Tian [et al.] // Physical Review. 2011. Vol. B 84. P. 125450.</mixed-citation></citation-alternatives></ref><ref id="cit7"><label>7</label><citation-alternatives><mixed-citation xml:lang="ru">Ghosh Bahniman, Katiyar Saurabb, Salimath Akshaykumar. Role of of electron-electron scattering on spin transport in single layer grapheme // AIP Advances. 2014. Vol. 4. P. 017116.</mixed-citation><mixed-citation xml:lang="en">Ghosh Bahniman, Katiyar Saurabb, Salimath Akshaykumar. Role of of electron-electron scattering on spin transport in single layer grapheme // AIP Advances. 2014. Vol. 4. P. 017116.</mixed-citation></citation-alternatives></ref><ref id="cit8"><label>8</label><citation-alternatives><mixed-citation xml:lang="ru">Mosko Martin, Moskova Antonina. Ensemble Monte Carlo simulation of electron-electron scattering: Improvement of conventional methods // Physical Review. 2010. Vol. 44, № 19. P. 10794-10803.</mixed-citation><mixed-citation xml:lang="en">Mosko Martin, Moskova Antonina. Ensemble Monte Carlo simulation of electron-electron scattering: Improvement of conventional methods // Physical Review. 2010. Vol. 44, № 19. P. 10794-10803.</mixed-citation></citation-alternatives></ref><ref id="cit9"><label>9</label><citation-alternatives><mixed-citation xml:lang="ru">Goodnick S.M., Lurgi P. Effect of electron-electron scattering on non equilibrium transport in quantum-well system // Physical Review. 1988. Vol. 37, № 5. P. 2578-2588.</mixed-citation><mixed-citation xml:lang="en">Goodnick S.M., Lurgi P. Effect of electron-electron scattering on non equilibrium transport in quantum-well system // Physical Review. 1988. Vol. 37, № 5. P. 2578-2588.</mixed-citation></citation-alternatives></ref><ref id="cit10"><label>10</label><citation-alternatives><mixed-citation xml:lang="ru">Stern Frank, Howard W.E. Properties of Semiconductor Surface Inversion Layers in the Electric Quantum Limit // Physical Review. 1967. Vol. 163, № 3. P. 163816-163835.</mixed-citation><mixed-citation xml:lang="en">Stern Frank, Howard W.E. Properties of Semiconductor Surface Inversion Layers in the Electric Quantum Limit // Physical Review. 1967. Vol. 163, № 3. P. 163816-163835.</mixed-citation></citation-alternatives></ref><ref id="cit11"><label>11</label><citation-alternatives><mixed-citation xml:lang="ru">First-principles analysis of electron-phonon interaction in grapheme / K.M. Borysenko [et al.] // Physical Review. 2010. Vol. B 81. P. 121412(R).</mixed-citation><mixed-citation xml:lang="en">First-principles analysis of electron-phonon interaction in grapheme / K.M. Borysenko [et al.] // Physical Review. 2010. Vol. B 81. P. 121412(R).</mixed-citation></citation-alternatives></ref><ref id="cit12"><label>12</label><citation-alternatives><mixed-citation xml:lang="ru">Elton J.G. Santos, Efthimios Kaxiras. Electric-Field Dependence of the Effective Dielectric Constant in Graphene // Nano Lett. 2013. Vol. 13, № 3. P. 898-902.</mixed-citation><mixed-citation xml:lang="en">Elton J.G. Santos, Efthimios Kaxiras. Electric-Field Dependence of the Effective Dielectric Constant in Graphene // Nano Lett. 2013. Vol. 13, № 3. P. 898-902.</mixed-citation></citation-alternatives></ref></ref-list><fn-group><fn fn-type="conflict"><p>The authors declare that there are no conflicts of interest present.</p></fn></fn-group></back></article>
