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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">bsuir</journal-id><journal-title-group><journal-title xml:lang="ru">Доклады БГУИР</journal-title><trans-title-group xml:lang="en"><trans-title>Doklady BGUIR</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">1729-7648</issn><issn pub-type="epub">2708-0382</issn><publisher><publisher-name>БГУИР</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.35596/1729-7648-2022-20-2-5-12</article-id><article-id custom-type="elpub" pub-id-type="custom">bsuir-3305</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>ЭЛЕКТРОНИКА, РАДИОФИЗИКА, РАДИОТЕХНИКА, ИНФОРМАТИКА</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>ELECTRONICS, RADIOPHYSICS, RADIOENGINEERING, INFORMATICS</subject></subj-group></article-categories><title-group><article-title>Эффекты рассеяния электронов в гексогональном нитриде бора</article-title><trans-title-group xml:lang="en"><trans-title>Electron Scattering in Boron Hexogonal Nitride</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Муравьёв</surname><given-names>В. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Muravyov</surname><given-names>V. V.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Чл.-корр. Национальной академии наук Республики Беларусь, д.т.н., профессор</p><p>220013, г. Минск, ул. П. Бровки, 6</p><p>тел. +375-017-293-80-70</p></bio><bio xml:lang="en"><p>Corr. Mem. of National Academy of Sciences of Belarus, Dr. of Sci., Professor</p><p>220013, Minsk, P. Brovka st., 6</p></bio><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Мищенко</surname><given-names>В. Н.</given-names></name><name name-style="western" xml:lang="en"><surname>Mishchenka</surname><given-names>V. N.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Мищенко Валерий Николаевич - к.т.н., доцент</p><p>220013, г. Минск, ул. П. Бровки, 6</p><p>тел. +375-017-293-80-70</p></bio><bio xml:lang="en"><p>Mishchenka Valery Nikolaevich - Cand. of Sci., Associate Professor</p><p>220013, Minsk, P. Brovka st., 6</p></bio><email xlink:type="simple">mishchenko@bsuir.by</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Белорусский государственный университет информатики и радиоэлектроники</institution></aff><aff xml:lang="en"><institution>Belarusian State University of Informatics and Radioelectronics</institution></aff></aff-alternatives><pub-date pub-type="collection"><year>2022</year></pub-date><pub-date pub-type="epub"><day>05</day><month>04</month><year>2022</year></pub-date><volume>20</volume><issue>2</issue><fpage>5</fpage><lpage>12</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Муравьёв В.В., Мищенко В.Н., 2022</copyright-statement><copyright-year>2022</copyright-year><copyright-holder xml:lang="ru">Муравьёв В.В., Мищенко В.Н.</copyright-holder><copyright-holder xml:lang="en">Muravyov V.V., Mishchenka V.N.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://doklady.bsuir.by/jour/article/view/3305">https://doklady.bsuir.by/jour/article/view/3305</self-uri><abstract><p>Выполнено исследование эффектов рассеяния электронов в объемном гексогональном нитриде бора (h-BN). В настоящее время материал h-BN, совместно с графеном, считается одним из наиболее перспективных материалов для формирования новых полупроводниковых приборов с хорошими характеристиками для диапазонов СВЧ и КВЧ. Рассмотрены основные электрофизические параметры и характеристики h-BN. Для исследования свойств этого материала использована трехдолинная К-М-Г зонная структура. Отмечено, что долина К характеризуется наименьшим энергетическим зазором между зоной проводимости и валентной зоной. Выполнен расчет величин эффективных масс электронов и коэффициентов непараболичности для долин К, М и Г. Представлены формулы, которые позволяют выполнить моделирование основных интенсивностей рассеяния электронов в h-BN. Рассмотрены и проанализированы полученные интенсивности рассеяния электронов в зависимости от энергии и температуры. Опираясь на полученные характеристики, становится возможной реализация статистического многочастичного метода Монте – Карло для определения характеристик переноса электронов в гетероструктурных полупроводниковых приборах, содержащих слои h-BN.</p></abstract><trans-abstract xml:lang="en"><p>Investigation the effects of electron scattering in boron hexogonal nitride (h-BN) was performed. At present, material h-BN, together with graphene, is considered to be one of the most promising materials for the formation of new semiconductor devices with good characteristics for the ranges of ultrahigh and extreme high frequency bands. The main electrophysical parameters and characteristics of h-BN was considered. For this material the three valley K-M-Г band structure has been used. It is noted that the K valley has the smallest energy gap between the conductivity zone and the valence zone. Calculation of relative electron masses and parabolicity coefficients in K, M and G valleys was performed. Formulas that allow to model the main electron scattering intensities in h-BN were presented. The obtained electron scattering intensities as a function of energy and temperature were considered and analyzed. Based on the obtained characteristics, it was possible to implement a statistical multi-particle Monte Carlo method to determine the characteristics of electron transfer in the heterostructure of a semiconductor devices containing layers of hexogonal boron nitride.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>гексагональный нитрид бора</kwd><kwd>полупроводниковая структура</kwd><kwd>интенсивность рассеяния</kwd><kwd>графен</kwd><kwd>метод Монте – Карло</kwd></kwd-group><kwd-group xml:lang="en"><kwd>hexogonal boron nitride</kwd><kwd>semiconductor structure</kwd><kwd>scattering intensity</kwd><kwd>graphene</kwd><kwd>Monte Carlo method</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Stolyarov M., Liu G., Shur M., Balandin A. Suppression of 1/f in near-ballistic h-BN-graphene-h-BN heterostructure field-effect transistors. Applied Physics Letters. 2015;107:023106. 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