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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">bsuir</journal-id><journal-title-group><journal-title xml:lang="ru">Доклады БГУИР</journal-title><trans-title-group xml:lang="en"><trans-title>Doklady BGUIR</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">1729-7648</issn><issn pub-type="epub">2708-0382</issn><publisher><publisher-name>БГУИР</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.35596/1729-7648-2020-18-8-62-68</article-id><article-id custom-type="elpub" pub-id-type="custom">bsuir-2933</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>ЭЛЕКТРОНИКА, РАДИОФИЗИКА, РАДИОТЕХНИКА, ИНФОРМАТИКА</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>ELECTRONICS, RADIOPHYSICS, RADIOENGINEERING, INFORMATICS</subject></subj-group></article-categories><title-group><article-title>Компьютерное моделирование сенсоров токсичных наночастиц на основе гетероструктурного полевого транзистора</article-title><trans-title-group xml:lang="en"><trans-title>Numerical simulation of the sensor for toxic nanoparticles based on the heterostructure field effect transistor</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Волчёк</surname><given-names>В. С.</given-names></name><name name-style="western" xml:lang="en"><surname>Volcheck</surname><given-names>V. S.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Волчёк В.С., младший научный сотрудник НИЛ 4.4 «Компьютерное проектирование микрои наноэлектронных систем» НИЧ</p><p>220013, Республика Беларусь, г. Минск, ул. П. Бровки, 6</p></bio><bio xml:lang="en"><p>Volcheck V.S., Research Assistant of the R&amp;D Laboratory 4.4 “Computer-Aided Design of Microand Nanoelectronic Systems” of R&amp;D Department </p><p>220013, Republic of Belarus, Minsk, P. Brovkа str., 6</p></bio><email xlink:type="simple">vlad.volchek@bsuir.by</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Стемпицкий</surname><given-names>В. Р.</given-names></name><name name-style="western" xml:lang="en"><surname>Stempitsky</surname><given-names>V. R.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Стемпицкий В.Р., к.т.н., доцент, заместитель начальника НИЧ</p><p>Минск</p></bio><bio xml:lang="en"><p>Stempitsky V.R., PhD, Associate Professor, Deputy Head of Research and Development Department</p><p>Minsk</p></bio><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Белорусский государственный университет информатики и радиоэлектроники</institution></aff><aff xml:lang="en"><institution>Belarusian State University of Informatics and Radioelectronics</institution></aff></aff-alternatives><pub-date pub-type="collection"><year>2020</year></pub-date><pub-date pub-type="epub"><day>27</day><month>12</month><year>2020</year></pub-date><volume>18</volume><issue>8</issue><fpage>62</fpage><lpage>68</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Волчёк В.С., Стемпицкий В.Р., 2020</copyright-statement><copyright-year>2020</copyright-year><copyright-holder xml:lang="ru">Волчёк В.С., Стемпицкий В.Р.</copyright-holder><copyright-holder xml:lang="en">Volcheck V.S., Stempitsky V.R.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://doklady.bsuir.by/jour/article/view/2933">https://doklady.bsuir.by/jour/article/view/2933</self-uri><abstract><p>Значительный рост массового производства продукции, в составе которой используются наночастицы, вызывает беспокойство по причине обнаружения их токсичного воздействия на живые организмы. Стандартным методом анализа токсичности веществ, в том числе наноматериалов, является токсикологическое тестирование, которое требует больших затрат материальных и временных ресурсов. Альтернативным подходом считается разработка моделей, которые позволяют прогнозировать влияние наноматериалов на биологические системы. В обоих случаях для детектирования наночастиц требуется эффективный электронный комплекс, состоящий из высокочувствительного сенсора и системы приема, обработки и передачи данных. В настоящее время активно ведутся фундаментальные и прикладные исследования, направленные на применение гетероструктурных полевых транзисторов (транзисторов с высокой подвижностью электронов) в качестве базы таких сенсоров. Цель данной работы – разработка методики компьютерного моделирования сенсоров токсичных наночастиц на базе гетероструктурного полевого транзистора. Объект исследования – приборная структура нитрид-галлиевого транзистора с высокой подвижностью электронов. Предметом исследования являются электрические характеристики транзистора, рассчитанные в статическом режиме. Результаты расчетов показывают, что зависимость между концентрацией наночастиц в исследуемой среде и поверхностной плотностью поляризационного заряда может быть использована в качестве основы методики компьютерного моделирования сенсоров токсичных наночастиц на базе гетероструктурного полевого транзистора. Преимущество предлагаемой методики состоит в использовании коэффициента масштабирования, предназначенного для калибровки плотности поляризационного заряда в соответствии с заданной концентрацией двумерного электронного газа. Полученные результаты могут быть использованы предприятиями электронной промышленности Республики Беларусь при разработке элементной базы сверхвысокочастотной электроники на основе нитрида галлия.</p></abstract><trans-abstract xml:lang="en"><p>A significant rise in the mass production of products that contain nanoparticles is of growing concern due to the detection of their toxic effects on living organisms. The standard method for analyzing the toxicity of substances, including nanomaterials, is toxicological testing, which requires the substantial consumption of time and material resources. An alternative approach is to develop models that predict the effect of nanomaterials on biological systems. In both cases, for the detection of nanoparticles an effective electronic complex consisting of a sensor with high sensitivity and a data reception/processing/transmission system is necessary. In recent times, fundamental and applied research activities aimed at the application of heterostructure field-effect transistors – high electron mobility transistors–as a base for such sensors have been undertaken. The purpose of this work is to develop a technique for modeling a sensor for toxic nanoparticles based on the heterostructure field-effect transistor. The object of the research is a gallium nitride high electron mobility transistor device structure. The subject of the research is the electrical characteristics of the transistor obtained in static mode. The calculation results show that the dependence between the concentration of the toxic nanoparticles in the test medium and the polarization charge surface density could serve as a base for modeling the sensor for toxic nanoparticles based on the heterostructure field-effect transistor. The primary advantage of the proposed technique is the use of the scaling parameter intended directly for calibrating the polarization charge density in accordance with the two-dimensional electron gas concentration. The obtained results can be utilized by the electronics industry of the Republic of Belarus for developing the hardware components of gallium nitride high-frequency electronics.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>наночастица</kwd><kwd>токсичность</kwd><kwd>функциональный материал</kwd><kwd>нитрид галлия</kwd><kwd>транзистор с высокой подвижностью электронов</kwd><kwd>гетероструктура</kwd><kwd>сенсор</kwd><kwd>моделирование</kwd></kwd-group><kwd-group xml:lang="en"><kwd>nanoparticle</kwd><kwd>toxicity</kwd><kwd>functional material</kwd><kwd>gallium nitride</kwd><kwd>high electron mobility transistor</kwd><kwd>heterostructure</kwd><kwd>sensor</kwd><kwd>simulation</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Sengul A.B., Asmatulu E. Toxicity of Metal and Metal Oxide Nanoparticles: A Review. Environmental Chemistry Letters. 2020;18:1659-1683. 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